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Tae-Hyoung (Tony) Kim
St.Paul, MN, United States
Profile Information

Educational History:
Ph.D Candidate at Univ. of Minnesota

MS from Korea University, Korea
BS from Korea University, Korea

Publications:
-Journals-
5. John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin Sapatnekar, and Chris Kim, ˇ°Stack Sizing for Optimal Current Drivability in Subthreshold Circuitsˇ±, IEEE Trans. on VLSI Systems, Vol. 16, No. 5, pp. 598-602, May 2008.



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